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Nanosurf – NaioAFM — AFM for small samples

All-in-one atomic force microscope for small samples and nanoeducation

The NaioAFM is the ideal atomic force microscope for nanoeducation and small sample measurements. This all-in-one AFM system provides solid performance and easy handling, with a price tag and footprint that fit anyone and any place.

  • Ready-to-use, table-top AFM.
  • Controller, scan head, airflow shielding, vibration isolation, camera, and sample positioning integrated into a single device.
  • All standard AFM operating modes available.
  • Integrated controller, XY-table, airflow shielding, and vibration isolation.
  • High resolution top view camera and side view sample observation built in.
  • No system setup needed: just plug into your PC and start the software.
  • Simple cantilever exchange: no adjustment required.
  • User-friendly software wizards quickly prepare measurement parameters.
  • Very competitive pricing.
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