Atomic Force Microscope
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NANO-flex
System for characterization of colloids by dynamic light scattering within a size range of 0.8 nm to 6.5 µm. Suitable for material systems with concentrations from ppm up to 40% vol., depending on substance type. Minimum is 1 droplet.
Particle Size Distribution
The NANO-flex® 180° DLS System measures size distributions in the range of 0.8 nm to 6.5 µm. The applied heterodyne 180° back scattering principle of the Nanotrac® is characterised by its high selectivity in the nano-range and is therefore also suitable for samples with broad size distribution. Highly concentrated samples are measured without interfering multiple scattering.
The applied Nanotrac® back scattering in the NANO-flex® is designed as a flexible measuring probe with 8 mm ø. Thus, it can be used in many ways, even in-situ and in the measuring cylinder of the Stabino®!
Molecular weight determination according to Debye
Further to the DLS size, a Debye plot feature with automatic dn/dc determination provides molecular weight.
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Nanosurf – Flex-Axiom — AFM for materials research
Versatility, performance and seamless application extensions
- Easy to use and high performance
- High resolution and low-noise design
- Modes and accessories to handle all your research needs
- Extremely modular to keep you productive
- Upgradable for life science and operation on large stages
Applications
- Imaging of samples in air and liquid
- Advanced mechanical, electrical and magnetical modes
- Electrochemical AFM
- Environmental control
- Scanning thermal microscopy and nano thermal analysis (SThM and Nano-TA)
- Advanced force spectroscopy
Lateral force microscopy on polystyrene-polybutadiene blend
The lateral force imaging mode was used to image local friction differences between the two polymers
Polystyrene and polybutadiene are shown to have quite different surface properties |
Overlay of difference between lateral deflection in forward and backward directions on top of topography. The difference is dominated by friction forces. Polystyrene (green areas) shows a higher friction than polybutadiene.System: FlexAFM with ES2 controller Scan size: 9 µm Cantilever: PPP-CONTSCROverlay of friction on topography |
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Overlay of average of lateral deflection in forward and backward directions on top of topography. The average is dominated by slope variations in the sample. The steepest slope (in red) is observed close to a large inset of polystyrene. The average shows no large color difference between the polymers in flatter areas.Overlay of slope on topography |
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Line section of lateral deflection difference and average of forward and backward scan directions. Line section of friction and slope signals |
Electrochemical AFM
This report demonstrates the capability of the FlexAFM in studies of charged solid-liquid interfaces
In order to carry out electrochemical(in-situ)AFM experiments, a conductive sample was mounted in an electrochemical liquid cell and connected to a lab-build bipotentiostat. We employed Clavilier-type Au(111) single crystal bead crystal electrodes with facets of micrometer-wide terraces. As examples, we studied the lifting of the Au(111)-(pxV3)reconstruction, surface oxidation as well as the growth and dissolution of copper clusters in sulfuric acid solution.
3D Copper cluster grown on Au(111)
KPFM using the Nanosurf FlexAFM
Kelvin probe force microscopy imaging
Kelvin Probe Force Microscopy (KPFM) is an extension of AFM. The technique was first published in 1991 by Nonnenmacher and coworkers. Using KPFM, images can be recorded that contain information on the local work function or local contact potential difference between tip and sample. Although all Nanite systems with an SPM S200 controller and all current Easyscan 2 AFM systems are in principle capable of performing KPFM, the FlexAFM has demonstrated best KPFM performance and is therefore the instrument of choice for this type of measurement. For a detailed description of requirements and procedures, please contact Nanosurf support. |
Topography. Scan Range: 10 µm x 10 µm. Z-range: 9 nm. |
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KPFM Signal. Scan range: 10 µm x 10 µm. Local charges that were placed on an insulating (oxide) surface layer in a "Swiss cross" pattern. Image courtesy: Marcin Kisiel, Thilo Glatzel and students of the Nanocurriculum of the University of Basel.KPFM signal (top) and simultaneously recorded Topography data (bottom) are shown. |
Nanosurf – FluidFM — Nano and cell manipulation
Nanofluidic tool for single-cell biology and next-level nanomanipulation
- Unique combination of AFM with Cytosurge FluidFM® technology
- Optical view of the sample and highly accurate pressure, force, and position control
- Access unique experiments: cell adhesion and spectroscopy mapping, single-cell manipulation, deposition and lithography even in liquid, injection and extraction, and more...
Applications
| Spatial manipulation of small objects and cells | |
| Cell adhesion and spectroscopy mapping | |
| Colloidal force spectroscopy | |
| Deposition and lithography in air and liquid |
Nanosurf – NaioAFM — AFM for small samples
All-in-one atomic force microscope for small samples and nanoeducation
The NaioAFM is the ideal atomic force microscope for nanoeducation and small sample measurements. This all-in-one AFM system provides solid performance and easy handling, with a price tag and footprint that fit anyone and any place.- Ready-to-use, table-top AFM.
- Controller, scan head, airflow shielding, vibration isolation, camera, and sample positioning integrated into a single device.
- All standard AFM operating modes available.
- Integrated controller, XY-table, airflow shielding, and vibration isolation.
- High resolution top view camera and side view sample observation built in.
- No system setup needed: just plug into your PC and start the software.
- Simple cantilever exchange: no adjustment required.
- User-friendly software wizards quickly prepare measurement parameters.
- Very competitive pricing.
Nanosurf – NaioSTM — STM for nanoeducation
- Atomic resolution in minutes.
- Extremely simple handling and reliable operation.
- Controller and scan head integrated into a single device: just connect USB and power.
